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amsight and toolcraft Collaborate to Advance Data-Driven Quality Management for Semiconductor AM Production

This article was originally posted on Manufacturing Industry News and eMagazine - Recent News .
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Summary
Amsight and Toolcraft have partnered to advance data-driven quality management for semiconductor additive manufacturing, emphasizing greater process transparency, traceability, and repeatability—key enablers for scaling AM to production in high-value sectors and aligning with the industry’s shift toward auditable, production-grade workflows.

What quality data or traceability capabilities do you think are most critical to make AM truly production-ready for semiconductors?
The collaboration underlines a broader shift within industrial AM, where process transparency, traceability, and repeatability are increasingly becoming central requirements for production adoption in high-value sectors such as semiconductors.

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pat
Jul 6 at 10:00 AM
On our metal AM cell, scrap only dropped after we started alarming on O2 ppm drift, recoater torque, and powder reuse count, not just pretty layer images. Will this run air-gapped and produce tamper-evident build logs for auditors? And does it tie melt-pool telemetry, powder lot/humidity, and calibration coupons to SPC limits with auto hold/rework?

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